Cross correlation of optical properties of thin films under thermal radiation

Document Type

Article

Publication Title

Journal of Applied Physics

Publication Date

12-1-1992

Abstract

Optical property and temperature distributions of a multilayer thin- (∼1 μm) film structure exposed to thermal radiation (1 μm≤λ≤8 μm) are dependent on film thicknesses, geometry, and material properties. Film thickness variation, simulated numerically, resulted in local minima and maxima in reflectivity and temperature distribution of these structures. We attribute this to a cross correlation phenomenon that occurs when the optical thickness of any two films in the structure is equal over a broad radiation spectrum.

Volume

72

Issue

10

First Page

4884

Last Page

4887

DOI

10.1063/1.352054

ISSN

00218979

Link to Full Text

Share

 
COinS