Submissions from 1997
The viscosity of germanium during substrate relaxation upon thermal anneal, Sara E. Rosenberg, Cynthia G. Madras, Peter Y. Wong, and Ioannis N. Miaoulis
Submissions from 1996
Numerical modeling of radiative properties of patterned wafers with sub-micron features, Jeffrey B. Hoppert, Ioannis N. Miaoulis, and Peter Y. Wong
Inelastic effects in a thermoplastic adhesive used for bonding a diamond disk, Cynthia G. Madras, Peter Y. Wong, and Ioannis N. Miaoulis
Viscoelastic deformation during thermal cycling of adhesively bonded optical coatings, Cynthia G. Madras, Peter Y. Wong, and Ioannis N. Miaoulis
Rapid thermal annealing of high-melting-point films on low-melting-point substrates, Sara E. Rosenberg, Peter Y. Wong, and Ioannis N. Miaoulis
Submissions from 1995
Measurement of the effect of temperature on stress distribution and deformation in multilayer optical thin film structures, Cynthia G. Madras, Peter Y. Wong, Ioannis N. Miaoulis, and L. M. Goldman
Adhesion and thermal deformation of ceramic/polymer heterostructures, Cynthia Madras, Peter Y. Wong, and Ioannis N. Miaoulis
Thermal evaluation of zone-melting recrystallization of thin-film structures over a wide range of melting points, Richard D. Robinson, Peter Y. Wong, and Ioannis N. Miaoulis
Analysis of deposition stress during thin-film growth on a relaxing substrate, Sara E. Rosenberg, Peter Y. Wong, and Ioannis N. Miaoulis
A theoretical study of the effect of thermal annealing on curvature changes in multilayered structures, Sara E. Rosenberg, Peter Y. Wong, and Ioannis N. Miaoulis
Coherent thermal radiation effects on temperature-dependent emissivity of thin-film structures on optically thick substrates, Peter Y. Wong, Christopher K. Hess, and Ioannis N. Miaoulis
Microscale reflectance spectrometry of thin-film structures in butterfly wing scales, Peter Y. Wong and Ioannis N. Miaoulis
Transient heating effects during rapid thermal processing of semiconductors, Peter Y. Wong and Ioannis N. Miaoulis
Transient and spatial radiative properties of patterned wafers during rapid thermal processing, Peter Y. Wong, Ioannis N. Miaoulis, and Cynthia G. Madras
Transient and spatial radiative properties of patterned wafers during rapid thermal processing, Peter Y. Wong, Ioannis N. Miaoulis, and Cynthia G. Madras
Submissions from 1994
Effect of substrate temperature on the crystallinity and stress of ion beam sputtered silicon on various substrates, Cynthia G. Madras, L. Goldman, Peter Y. Wong, and Ioannis N. Miaoulis
Thermal and deposition stress relaxation in low-melting-point substrates with high-melting-point films, Sara E. Rosenberg, Peter Y. Wong, and Ioannis N. Miaoulis
Effect of microscale and macroscale patterns on the radiative heating of multilayer thin-film structures, Peter Y. Wong, Bradley D. Heilman, and Ioannis N. Miaoulis
Thermal-radiation absorption characteristics of patterned wafers during rapid thermal processing, Peter Y. Wong and Ioannis N. Miaoulis
Processing uniformity issues during zone-melting recrystallization of large thin-film areas, Peter Y. Wong, Richard D. Robinson, and Ioannis N. Miaoulis
Submissions from 1993
The effects of natural convection and conduction in a zone-melting-recrystallization chamber, Bradley D. Heilman, Matthew A. Marston, Peter Y. Wong, and Ioannis N. Miaoulis
Microscale radiation effects in multilayer thin-film structures during rapid thermal processing, Peter Y. Wong, Christopher K. Hess, and Ioannis N. Miaoulis
Submissions from 1992
Thermal effects induced by isolated step perturbations within thin films during processing with a radiant heat source, Christopher K. Hess, Peter Y. Wong, and Ioannis N. Miaoulos
Thermal Analysis of Zone-Melting Recrystallization of Silicon-on-Insulator Structures with an Infrared Heat Source: An overview, Ioannis N. Miaoulis, Peter Y. Wong, S. M. Yoon, R. D. Robinson, and C. K. Hess
Thermal radiation modeling in multilayer thin film structures, Peter Y. Wong, Christopher K. Hess, and Ioannis N. Miaoulis
Cross correlation of optical properties of thin films under thermal radiation, Peter Y. Wong, Lloyd M. Trefethen, and Ioannis N. Miaoulis
Submissions from 1991
Thermal modeling of zone-melting-recrystallization processing of silicon-on-insulator film structures, Ioannis N. Miaoulis, Peter Y. Wong, Joseph D. Lipman, and James S. Im
Thermal analysis of multilayer thin film structure processing with an infrared heat source. An overview, Miaoulis N. Miaoulis, S. M. Yoon, R. D. Robinson, C. K. Hess, and Peter Y. Wong
Optical effects of multilayer thin-film structures during zone-melting recrystallization with an infrared heat source, Peter Y. Wong and Ioannis N. Miaoulis
Cross-correlation thermal radiation phenomena in multilayer thin-film processing, Peter Y. Wong, Lloyd M. Trefethen, and Ioannis N. Miaoulis
Submissions from 1990
Microscale heat transfer phenomena in multilayer thin film processing with a radiant heat source, Peter Y. Wong, Ioannis N. Miaoulis, and Paul Zavracky
Submissions from 1989
Numerical simulation of the radiation effects in graphite-strip zone-melting recrystallization of thin silicon films, J. D. Lipman, Peter Y. Wong, Ioannis N. Miaoulis, and J. S. Im
Zone-melting processing of thick high-Tcsuperconducting films, Ioannis N. Miaoulis, J. Lipman, D. A. Flodman, Peter Y. Wong, M. W. Wolfson, J. Barrett, and A. Nelson
Texture enhancement of thick high-Tc superconductive films by zone-melting, Ioannis N. Miaoulis, J. Lipman, Peter Y. Wong, D. Flodman, M. W. Wolfson, J. III Barrett, and A. Nelson
